rejection attributes

• IN_BAD_FRAME This event was detected in a frame where something was incoherent, hinting at corrupted data.

• COSMIC_RAY This event was detected within a large pattern (size 31). It was most likely a particle event (MIP). Not set yet for PN as the SAS pattern recognition is performed after the SAS MIP rejection.

• ON_BADPIX This event was detected at the location of a registered bad pixel (not declared on board).

• OUT_OF_CCD_WINDOW This event was detected outside the CCD or the current window.

• SECONDARY This event is a secondary event in a pattern and all the relevant event information is stored with the main event after the pattern recombination.

• TRAILING This event is most likely reemission of an event occuring immediately next to it towards the CAMEX and just above the threshold. Its charge is already corrected for in the CTI correction.

• MIP_ASSOCIATED This event is detected in columns that contain high-energy particle events (MIPs) or in adjacent columns. It may be associated to the MIP itself. Even if unrelated its energy cannot be determined with sufficient accuracy because CTI corrections do not apply anymore.