Calibration Access and Data Handbook

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Modifies the PSF map, by applying the effect of EPIC charge transfer smearing. This should be called BEFORE any pile-up correction (see 3.3.31) in order to ensure that the correct fraction of INPUT detected events are re-distributed.

The routine consults the ModeParams files for a smearing fraction, and takes the integrated surface brightness in each CCD column, and reduces the brightness according to this fraction, then redistributes the smeared fraction evenly over the column.

Michael Smith 2011-09-20