Calibration Access and Data Handbook
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Modifies the PSF map, by applying the effect of EPIC charge transfer
smearing. This should be called BEFORE any pile-up correction
(see 3.3.31) in order to ensure that the correct
fraction of INPUT detected events are re-distributed.
The routine consults the ModeParams files for a smearing fraction, and
takes the integrated surface brightness in each CCD column, and reduces
the brightness according to this fraction, then redistributes the smeared
fraction evenly over the column.
Michael Smith
2011-09-20